Heikki Kettunen

Henkilökunnan yhteystiedot saatavilla yliopiston yhteystietohausta.

Aktiiviset JYU-affiliaatiot

Fysiikan laitos, Tutkimusinsinööri

Aiemmat tai muut työsuhteet

Heikki Kettunen, Fysiikan laitos (Jyväskylän yliopisto), Laboratorioinsinööri

Tieteenalat

114 Fysiikka (Luonnontieteet)

Hankkeet, joissa vastuullinen johtaja

RADEF aseman hyödyntäminen componenttien säteilytystesteihin 2018-2020
- European Space Agency
01.01.2018-28.02.2023

Hankkeet, joissa on hanketiimin jäsen

ESA GSTP
- - Virtanen, Ari
- European Space Agency
18.03.2015-31.05.2020
Estimation of proton induced Single Event Effect rates in very deep submicron technologies
- - Javanainen, Arto
- European Space Agency
01.04.2020-31.03.2022
R2RAM Radiation Hard Resistive Random-Ac
- - Virtanen, Ari
- Euroopan komissio
01.01.2015-31.12.2016
Radiation Characterisation of EEE components for ESA space applications
- - Javanainen, Arto
- European Space Agency
01.11.2019-31.10.2021

Julkaisut

1/8

Aalto-1, multi-payload CubeSat : Design, integration and launch (2021) Praks,J.; et al.; A1
Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment (2021) Söderström, Daniel; et al.; A1
Irradiation of the head reduces adult hippocampal neurogenesis and impairs spatial memory, but leaves overall health intact in rats (2021) Lensu, Sanna; et al.; A1; OA
Radiation hardness assurance through system-level testing : risk acceptance, facility requirements, test methodology and data exploitation (2021) Coronetti, Andrea; et al.; A1; OA
Direct Ionization Impact on Accelerator Mixed-Field Soft Error Rate (2020) Alía, R. G.; et al.; A1; OA
Results on radiation hardness of black silicon induced junction photodetectors from proton and electron radiation (2020) Heinonen, J; et al.; A1
SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below (2020) Coronetti, Andrea; et al.; A4; OA
Mechanisms of Electron-Induced Single Event Upsets in Medical and Experimental Linacs (2018) Tali, Maris; et al.; A1; OA
Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random-Access Memory (2018) Bosser, Alexandre; et al.; A1; OA
Application and development of ion-source technology for radiation-effects testing of electronics (2017) Kalvas, Taneli; et al.; A1
Determination of electronic stopping powers of 0.05–1 MeV/u 131Xe ions in C-, Ni- and Au-absorbers with calorimetric low temperature detectors (2017) Echler, A.; et al.; A1
Energy loss and straggling of MeV Si ions in gases (2017) Vockenhuber, C.; et al.; A1; OA
Single Event Upsets Induced by Direct Ionization from Low-Energy Protons in Floating Gate Cells (2017) Bagatin, Marta; et al.; A1; OA
Effects of high-energy electrons in advanced NAND flash memories (2016) Bagatin, Marta; et al.; A4
A simple timestamping data acquisition system for ToF-ERDA (2015) Rossi, Mikko; et al.; A1; OA
First observation of superdeformed states in 191Bi (2015) Nyman, Markus; et al.; A1
High-spin states beyond the proton drip-line: Quasiparticle alignments in Cs-113 (2015) Wady, P.T.; et al.; A1; OA
Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs (2015) Bosser, Alexandre; et al.; A1
Application of calorimetric low temperature detectors (CLTD's) for precise stopping power measurements of heavy ions in matter (2014) Echler, A.; et al.; A1
Low Energy Protons at RADEF - Application to Advanced eSRAMs (2014) Kettunen, Heikki; et al.; A4