Heikki Kettunen

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• Methods for Proton Direct Ionization SEU Characterization and Orbital Error-Rate Estimation (2024) Glorieux, Maximilien; et al.; A1
• Effect of 20 MeV Electron Radiation on Long Term Reliability of SiC Power MOSFETs (2023) Niskanen, Kimmo; et al.; A1; OA; 
• PIPS Diode Test Setup for Heavy Ion Beam Spectral Characterization (2023) Borel, Thomas; et al.; A1
• Proton Direct Ionization in Sub-Micron Technologies : Test Methodologies and Modelling (2023) Lüdeke, Sascha; et al.; A1; OA
• Proton Irradiation-Induced Reliability Degradation of SiC Power MOSFET (2023) Niskanen, Kimmo; et al.; A1; OA
• Technology Dependence of Stuck Bits and Single Event Upsets in 110, 72, and 63-nm SDRAMs (2023) Söderström, Daniel; et al.; A1; OA
• Evaluation of radiation stability of electron beam irradiated Nafion® and sulfonated poly(ether ether ketone) membranes (2022) Pajuste, E.; et al.; A1; OA
• Heavy-ion induced single event effects and latent damages in SiC power MOSFETs (2022) Martinella, C.; et al.; A1; OA
• Properties of Gd-Doped Sol-Gel Silica Glass Radioluminescence under Electron Beams (2022) Söderström, Daniel; et al.; A1; OA
• Aalto-1, multi-payload CubeSat : Design, integration and launch (2021) Praks,J.; et al.; A1; OA
• Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment (2021) Söderström, Daniel; et al.; A1; OA
• Improved stability of black silicon detectors using aluminum oxide surface passivation (2021) Heinonen, Juha; et al.; A4; OA; 978-1-5106-4549-3
• Irradiation of the head reduces adult hippocampal neurogenesis and impairs spatial memory, but leaves overall health intact in rats (2021) Lensu, Sanna; et al.; A1; OA
• Radiation hardness assurance through system-level testing : risk acceptance, facility requirements, test methodology and data exploitation (2021) Coronetti, Andrea; et al.; A1; OA
• Radioluminescence Response of Ce-, Cu-, and Gd-Doped Silica Glasses for Dosimetry of Pulsed Electron Beams (2021) Söderström, Daniel; et al.; A1; OA

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