Mikko Rossi

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• Effect of 20 MeV Electron Radiation on Long Term Reliability of SiC Power MOSFETs (2023) Niskanen, Kimmo; et al.; A1; OA 
• Proton Direct Ionization in Sub-Micron Technologies : Test Methodologies and Modelling (2023) Lüdeke, Sascha; et al.; A1; OA 
• Proton Irradiation-Induced Reliability Degradation of SiC Power MOSFET (2023) Niskanen, Kimmo; et al.; A1; OA 
• Evaluation of radiation stability of electron beam irradiated Nafion® and sulfonated poly(ether ether ketone) membranes (2022) Pajuste, E.; et al.; A1; OA 
• Heavy-ion induced single event effects and latent damages in SiC power MOSFETs (2022) Martinella, C.; et al.; A1; OA 
• Improved stability of black silicon detectors using aluminum oxide surface passivation (2021) Heinonen, Juha; et al.; A4; OA; 978-1-5106-4549-3
• Results on radiation hardness of black silicon induced junction photodetectors from proton and electron radiation (2020) Heinonen, J; et al.; A1
• SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below (2020) Coronetti, Andrea; et al.; A4; OA
• Determination of electronic stopping powers of 0.05–1 MeV/u 131Xe ions in C-, Ni- and Au-absorbers with calorimetric low temperature detectors (2017) Echler, A.; et al.; A1
• Energy loss and straggling of MeV Si ions in gases (2017) Vockenhuber, C.; et al.; A1; OA
• A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing (2015) Bosser, Alexandre; et al.; A4
• A simple timestamping data acquisition system for ToF-ERDA (2015) Rossi, Mikko; et al.; A1; OA 
• Application of calorimetric low temperature detectors (CLTD's) for precise stopping power measurements of heavy ions in matter (2014) Echler, A.; et al.; A1
• Low Energy Protons at RADEF - Application to Advanced eSRAMs (2014) Kettunen, Heikki; et al.; A4
• SEGR in SiO2-Si3N4 Stacks (2014) Javanainen, Arto; et al.; A1; OA

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