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Jukka Jaatinen
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Jukka
Jaatinen
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Department of Physics
,
Laboratory Engineer
Fields of science
114 Physical sciences (Natural sciences)
Publications and other outputs
Effect of 20 MeV Electron Radiation on Long Term Reliability of SiC Power MOSFETs
(
2023
)
Niskanen, Kimmo; et al.
;
A1
;
OA
Proton Direct Ionization in Sub-Micron Technologies : Test Methodologies and Modelling
(
2023
)
Lüdeke, Sascha; et al.
;
A1
;
OA
Proton Irradiation-Induced Reliability Degradation of SiC Power MOSFET
(
2023
)
Niskanen, Kimmo; et al.
;
A1
;
OA
Heavy-ion induced single event effects and latent damages in SiC power MOSFETs
(
2022
)
Martinella, C.; et al.
;
A1
;
OA
Observation of an ultralow-Q-value electron-capture channel decaying to 75As via a high-precision mass measurement
(
2022
)
Ramalho, M.; et al.
;
A1
;
OA
Improved stability of black silicon detectors using aluminum oxide surface passivation
(
2021
)
Heinonen, Juha; et al.
;
A4
;
OA
;
978-1-5106-4549-3
Results on radiation hardness of black silicon induced junction photodetectors from proton and electron radiation
(
2020
)
Heinonen, J; et al.
;
A1
SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below
(
2020
)
Coronetti, Andrea; et al.
;
A4
;
OA
Methodologies for the Statistical Analysis of Memory Response to Radiation
(
2016
)
Bosser, Alexandre; et al.
;
A1
;
OA
Low Energy Protons at RADEF - Application to Advanced eSRAMs
(
2014
)
Kettunen, Heikki; et al.
;
A4
SEGR in SiO2-Si3N4 Stacks
(
2014
)
Javanainen, Arto; et al.
;
A1
;
OA
Semi-Empirical Model for SEGR Prediction
(
2013
)
Javanainen, Arto; et al.
;
A1
Proton and Gamma Irradiation Tests of COTS- and RadHard Optocouplers
(
2009
)
Jaatinen, Jukka
;
G3
Last updated on 2024-17-04 at 21:13