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Jukka Jaatinen

Henkilökunnan yhteystiedot saatavilla yliopiston yhteystietohausta.

Aktiiviset JYU-affiliaatiot

Fysiikan laitos, Laboratorioinsinööri

Tieteenalat

114 Fysiikka (Luonnontieteet)

Julkaisut ja muut tuotokset

Effect of 20 MeV Electron Radiation on Long Term Reliability of SiC Power MOSFETs (2023) Niskanen, Kimmo; et al.; A1; OA
Proton Direct Ionization in Sub-Micron Technologies : Test Methodologies and Modelling (2023) Lüdeke, Sascha; et al.; A1; OA
Proton Irradiation-Induced Reliability Degradation of SiC Power MOSFET (2023) Niskanen, Kimmo; et al.; A1; OA
Heavy-ion induced single event effects and latent damages in SiC power MOSFETs (2022) Martinella, C.; et al.; A1; OA
Observation of an ultralow-Q-value electron-capture channel decaying to 75As via a high-precision mass measurement (2022) Ramalho, M.; et al.; A1; OA
Improved stability of black silicon detectors using aluminum oxide surface passivation (2021) Heinonen, Juha; et al.; A4; OA; 978-1-5106-4549-3
Results on radiation hardness of black silicon induced junction photodetectors from proton and electron radiation (2020) Heinonen, J; et al.; A1
SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below (2020) Coronetti, Andrea; et al.; A4; OA
Methodologies for the Statistical Analysis of Memory Response to Radiation (2016) Bosser, Alexandre; et al.; A1; OA
Low Energy Protons at RADEF - Application to Advanced eSRAMs (2014) Kettunen, Heikki; et al.; A4
SEGR in SiO2-Si3N4 Stacks (2014) Javanainen, Arto; et al.; A1; OA
Semi-Empirical Model for SEGR Prediction (2013) Javanainen, Arto; et al.; A1
Proton and Gamma Irradiation Tests of COTS- and RadHard Optocouplers (2009) Jaatinen, Jukka; G3

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