Alexandre Bosser

No active affiliation

Publications

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random-Access Memory (2018) Bosser, Alexandre; et al.; A1; OA
Heavy Ion Induced Degradation in SiC Schottky Diodes : Bias and Energy Deposition Dependence (2017) Javanainen, Arto; et al.; A1; OA
Heavy-Ion-Induced Degradation in SiC Schottky Diodes : Incident Angle and Energy Deposition Dependence (2017) Javanainen, Arto; et al.; A1; OA
Single-event effects of space and atmospheric radiation on memory components (2017) Bosser, Alexandre; G5; OA
Soft errors in commercial off-the-shelf static random access memories (2017) Dilillo, L.; et al.; A2
Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions (2016) Gupta, Viyas; et al.; A1
Incident angle effect on heavy ion induced reverse leakage current in SiC Schottky diodes (2016) Javanainen, Arto; et al.; A4
Methodologies for the Statistical Analysis of Memory Response to Radiation (2016) Bosser, Alexandre; et al.; A1; OA
A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing (2015) Bosser, Alexandre; et al.; A4
Heavy-Ion Radiation Impact on a 4Mb FRAM under Different Test Conditions (2015) Gupta, V.; et al.; A4
Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs (2015) Bosser, Alexandre; et al.; A1
Real-time SRAM based particle detector (2015) Dilillo, Luigi; et al.; A4
SEE on Different Layers of Stacked-SRAMs (2015) Gupta, V.; et al.; A1
Dynamic Test Methods for COTS SRAMs (2014) Tsiligiannis, G.; et al.; A1
Low Energy Protons at RADEF - Application to Advanced eSRAMs (2014) Kettunen, Heikki; et al.; A4
SEGR in SiO2-Si3N4 Stacks (2014) Javanainen, Arto; et al.; A1; OA