Go to Header
Go to Navigation
Go to Content
Go to Footer
Guide
Login (ext. users)
Login (JyU account)
Accessibility
Finnish (Finland)
List of people
>
Andrea Coronetti
Home
Persons
Organisations
Projects
Publications
Research datasets
Fields of science
Funding programs
Follow-up groups
Keywords (YSO)
Andrea
Coronetti
No active affiliation
Publications and other outputs
Analysis of the photoneutron field near the THz dump of the CLEAR accelerator at CERN with SEU measurements and simulations
(
2022
)
Lerner, Giuseppe; et al.
;
A1
;
OA
Measurements of Low-Energy Protons using a Silicon Detector for Application to SEE Testing
(
2022
)
Cazzaniga, Carlo; et al.
;
A1
;
OA
;
New Capabilities of the FLUKA Multi-Purpose Code
(
2022
)
Ahdida, C.; et al.
;
A1
;
OA
0.1-10 MeV Neutron Soft Error Rate in Accelerator and Atmospheric Environments
(
2021
)
Cecchetto, Matteo; et al.
;
A1
;
OA
Assessment of Proton Direct Ionization for the Radiation Hardness Assurance of Deep Submicron SRAMs Used in Space Applications
(
2021
)
Coronetti, Andrea; et al.
;
A1
;
OA
High-energy hadron testing and in-orbit single-event latchup predictions and boundaries
(
2021
)
Coronetti, Andrea; et al.
;
A4
;
978-1-6654-3794-3
Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies
(
2021
)
Martinella, Corinna; et al.
;
A1
;
OA
Pulsed Electron Beam induced SEU Effects in a SRAM memory
(
2021
)
Wyrwoll, Vanessa; et al.
;
A4
;
978-1-6654-3794-3
Radiation hardness assurance through system-level testing : risk acceptance, facility requirements, test methodology and data exploitation
(
2021
)
Coronetti, Andrea; et al.
;
A1
;
OA
Relevance and guidelines of radiation effect testing beyond the standards for electronic devices and systems used in space and at accelerators
(
2021
)
Coronetti, Andrea
;
G5
;
OA
;
978-951-39-8915-6
Silicon solid-state detectors for monitoring high-energy accelerator mixed field radiation environments
(
2021
)
Bilko, Kacper; et al.
;
A4
;
978-1-6654-3794-3
Study of SEU sensitivity of SRAM-Based Radiation Monitors in 65 nm CMOS
(
2021
)
Wang, J.; et al.
;
A1
;
OA
The pion single-event latch-up cross-section enhancement : mechanisms and consequences for accelerator hardness assurance
(
2021
)
Coronetti, Andrea; et al.
;
A1
;
OA
Thermal-to-high-energy neutron SEU characterization of commercial SRAMs
(
2021
)
Coronetti, Andrea; et al.
;
A4
;
978-1-6654-4205-3
SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below
(
2020
)
Coronetti, Andrea; et al.
;
A4
;
OA
Last updated on 2022-15-08 at 18:29
