Go to Header
Go to Navigation
Go to Content
Go to Footer
Guide
Login (ext. users)
Login (JyU account)
Accessibility
Finnish (Finland)
List of people
>
Andrea Coronetti
Home
Persons
Organisations
Projects
Publications
Research datasets
Fields of science
Funding programs
Follow-up groups
Keywords (YSO)
Andrea
Coronetti
No active affiliation
Previous, inactive or other affiliations
Faculty of Mathematics and Science
(University of Jyväskylä)
,
Doctoral Student
,
Ended
Publications and other outputs
Analysis of the photoneutron field near the THz dump of the CLEAR accelerator at CERN with SEU measurements and simulations
(
2022
)
Lerner, Giuseppe; et al.
;
A1
;
OA
Measurements of Low-Energy Protons using a Silicon Detector for Application to SEE Testing
(
2022
)
Cazzaniga, Carlo; et al.
;
A1
;
OA
;
New Capabilities of the FLUKA Multi-Purpose Code
(
2022
)
Ahdida, C.; et al.
;
A1
;
OA
0.1-10 MeV Neutron Soft Error Rate in Accelerator and Atmospheric Environments
(
2021
)
Cecchetto, Matteo; et al.
;
A1
;
OA
Assessment of Proton Direct Ionization for the Radiation Hardness Assurance of Deep Submicron SRAMs Used in Space Applications
(
2021
)
Coronetti, Andrea; et al.
;
A1
;
OA
High-energy hadron testing and in-orbit single-event latchup predictions and boundaries
(
2021
)
Coronetti, Andrea; et al.
;
A4
;
978-1-6654-3794-3
Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies
(
2021
)
Martinella, Corinna; et al.
;
A1
;
OA
Pulsed Electron Beam induced SEU Effects in a SRAM memory
(
2021
)
Wyrwoll, Vanessa; et al.
;
A4
;
978-1-6654-3794-3
Radiation hardness assurance through system-level testing : risk acceptance, facility requirements, test methodology and data exploitation
(
2021
)
Coronetti, Andrea; et al.
;
A1
;
OA
Relevance and guidelines of radiation effect testing beyond the standards for electronic devices and systems used in space and at accelerators
(
2021
)
Coronetti, Andrea
;
G5
;
OA
;
978-951-39-8915-6
Silicon solid-state detectors for monitoring high-energy accelerator mixed field radiation environments
(
2021
)
Bilko, Kacper; et al.
;
A4
;
978-1-6654-3794-3
Study of SEU sensitivity of SRAM-Based Radiation Monitors in 65 nm CMOS
(
2021
)
Wang, J.; et al.
;
A1
;
OA
The pion single-event latch-up cross-section enhancement : mechanisms and consequences for accelerator hardness assurance
(
2021
)
Coronetti, Andrea; et al.
;
A1
;
OA
Thermal-to-high-energy neutron SEU characterization of commercial SRAMs
(
2021
)
Coronetti, Andrea; et al.
;
A4
;
978-1-6654-4205-3
SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below
(
2020
)
Coronetti, Andrea; et al.
;
A4
;
OA
Last updated on 2022-15-08 at 18:29
