Single Event Radiation Effects in Harden (ESA-NPI)

Main funder

Funds granted by main funder (€)

90 000,00

Funding program

Funding programs

Project timetable

Project start date: 01/01/2016

Project end date: 30/11/2018


In this work, the physical mechanisms of electron-induced single-event effects have been
studied. Simulations using Monte Carlo codes such as FLUKA have been performed to
study in more detailed the mechanisms by which electrons deposit charge in the sensitive
volumes in modern electronic devices. Experimental results from several irradiation
campaigns at facilities such as VESPER at CERN in Geneva, Switzerland, and RADEF
in Jyväskylä, Finland have shown that electron-induced single-event effects are possible.
Furthermore, experimental results suggest that these events can occur in even larger
technology nodes as several device generations have been tested. Proof for potentially
destructive single-event latch-up event has been shown both through experimental results
and through simulations. In addition, the impact of low-energy protons in a mixed-field
environment has been evaluated through simulations and through experimental campaigns
at both the CHARM facility at CERN and at the RADEF facility. Recommendations for
radiation hardness assurance for environments with an abundance of electrons such as the
ESA JUICE mission have been made and a comparison to the more traditional strategies
has been performed.

Principal Investigator

Other persons related to this project (JYU)

Contact person (yes/no): Yes

Primary responsible unit

Free keywords

Single-event effects, single-event upsets, electrons, radiation hardness assurance (RHA)

Last updated on 2020-26-06 at 15:07