A4 Article in conference proceedings
Stuck and Weakened Bits in SDRAM from a Heavy-Ion Microbeam (2019)


Söderström, D., Matana Luza, L., Bosser, A., Gil, T., Voss, K.-O., Kettunen, H., Javanainen, A., & Dilillo, L. (2019). Stuck and Weakened Bits in SDRAM from a Heavy-Ion Microbeam. In RADECS 2019 : Proceedings of the 19th European Conference on Radiation and Its Effects on Components and Systems. IEEE. https://doi.org/10.1109/RADECS47380.2019.9745715


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Publication details

All authors or editorsSöderström, Daniel; Matana Luza, Lucas; Bosser, Alexandre; Gil, Thierry; Voss, Kay-Obbe; Kettunen, Heikki; Javanainen, Arto; Dilillo, Luigi

Parent publicationRADECS 2019 : Proceedings of the 19th European Conference on Radiation and Its Effects on Components and Systems

Place and date of conferenceMontpellier, France16.-20.9.2019

ISBN978-1-7281-5700-9

eISBN978-1-7281-5699-6

ISSN0379-6566

eISSN1609-0438

Publication year2019

Publication date04/04/2022

PublisherIEEE

Publication countryUnited States

Publication languageEnglish

DOIhttps://doi.org/10.1109/RADECS47380.2019.9745715

Publication open accessNot open

Publication channel open access


Abstract

Stuck and weakened bits in the ISSI 512 Mb SDRAM was investigated in irradiation experiments with a heavy ion microbeam in the GSI facility. Delidded memories were tested in gold and calcium ion beams at 4.8 MeV/u, and stuck bits in the memory from the irradiation were investigated. To study weakened but not fully stuck bits after irradiation, parameters such as the refresh frequency of the memories was varied. The effect on the number of stuck bits from reading and writing the memory was studied, as well as the effect from waiting a time span between writing and reading the memory. These parameters were found to matter in the observed number of errors in the memory. Data on the findings from the microbeam irradiation from tests with different test modes are presented in this paper regarding suck bits and bit upsets. The test modes include dynamic March test and data retention tests with only refresh operations during irradiation.


Keywordsradiation physicsionising radiationmemories (computing)random access memories

Free keywordsradiation effects; gold; calcium; Europe; writing; ions; SDRAM; microbeam; radiation effects; stuck bits; weak bits


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Last updated on 2024-11-03 at 14:30