A1 Journal article (refereed)
Proton direct ionization upsets at tens of MeV (2023)

Coronetti, A., Alia, R. G., Lucsanyi, D., Wang, J., Saigne, F., Javanainen, A., Leroux, P., & Prinzie, J. (2023). Proton direct ionization upsets at tens of MeV. IEEE Transactions on Nuclear Science, 70(4), 314-321. https://doi.org/10.1109/TNS.2022.3207877

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Publication details

All authors or editors: Coronetti, Andrea; Alia, Ruben Garcia; Lucsanyi, David; Wang, Jialei; Saigne, Frederic; Javanainen, Arto; Leroux, Paul; Prinzie, Jeffrey

Journal or series: IEEE Transactions on Nuclear Science

ISSN: 0018-9499

eISSN: 1558-1578

Publication year: 2023

Publication date: 20/09/2022

Volume: 70

Issue number: 4

Pages range: 314-321

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication country: United States

Publication language: English

DOI: https://doi.org/10.1109/TNS.2022.3207877

Publication open access: Openly available

Publication channel open access: Partially open access channel

Publication is parallel published (JYX): https://jyx.jyu.fi/handle/123456789/87502


Experimental mono-energetic proton single-event upset (SEU) cross-sections of a 65 nm low core-voltage static random access memory (SRAM) were found to be exceptionally high not only at low energies (< 3 MeV), but also at energies > 3 MeV and extending up to tens of MeV. The SEU cross-section from 20 MeV protons exceed the 200 MeV proton SEU cross-section by almost a factor of 3. Similarly, mono-energetic neutron cross-sections at 14 MeV are about a factor of 3 lower than the 20 MeV proton cross-section. Thanks to Monte-Carlo (MC) simulations it was determined that this strong enhancement is due to the proton direct ionization process as opposed to the elastic and inelastic scattering processes that dominate the SEU response above 3 MeV in other SRAMs. As shown by means of a detailed energy deposition scoring analysis, however, this does not appear to be caused by the critical charge of the SRAM being lower than the charge resulting from the average proton ionization through the linear energy transfer (LET). On the other hand, this is caused by high-energy δ-rays (> 1 keV) that can deposit their full kinetic energy within the sensitive volume (SV) of a cell despite their range being theoretically much longer than the characteristic size of the SV. Multiple scattering events are responsible for increasing the trajectory path of the δ-rays within the sensitive volume, resulting in a 6 fold increase in the probability of upset with respect to the sole electron ionization.

Keywords: protons; neutrons; ions; ionising radiation; Monte Carlo methods; energy transfer; kinetic energy; memories (computing)

Free keywords: protons; random access memory; scattering; neutrons; trajectory; single event upsets; proton direct ionization; delta-rays; Monte-Carlo simulations;

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Ministry reporting: Yes

Reporting Year: 2022

JUFO rating: 1

Last updated on 2023-03-10 at 13:06