B3 Non-refereed conference proceedings
Analysis of i-V and complex impedance data for Ti/Au transition-edge sensors (2009)


Kinnunen, K., Palosaari, M., Maasilta, I., Ridder, M., van der Kuur, J., & Hoevers, H. (2009). Analysis of i-V and complex impedance data for Ti/Au transition-edge sensors. In in Extended Abstracts of the 12th International Superconductive Electronics Conference (pp. xx).


JYU authors or editors


Publication details

All authors or editors: Kinnunen, Kimmo; Palosaari, Mikko; Maasilta, Ilari; Ridder, M.L.; van der Kuur, J.; Hoevers, H.F.C.

Parent publication: in Extended Abstracts of the 12th International Superconductive Electronics Conference

Publication year: 2009

Issue number: xx

Pages range: xx

Publication language: English

Publication open access: Not open

Publication channel open access: 

Additional information: K. M. Kinnunen, M. R. Palosaari, I. J. Maasilta, M. L. Ridder, J. van der Kuur, and H. F. C. Hoevers Analysis of i-V and complex impedance data for Ti/Au transition-edge sensors in Extended Abstracts of the 12th International Superconductive Electronics Conference xx (2009) xx


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Ministry reporting: Yes

Preliminary JUFO rating: Not rated


Last updated on 2023-02-02 at 13:00