A1 Journal article (refereed)
Depth profiling of Al2O3+ TiO2 nanolaminates by means of a time-of-flight energy spectromete (2011)

Laitinen, M., Sajavaara, T., Rossi, M., Julin, J., Puurunen, R.L., Suni, T., Ishida, T., Fujita, H., Arstila, K., Brijs, B., & Whitlow, H. (2011). Depth profiling of Al2O3+ TiO2 nanolaminates by means of a time-of-flight energy spectromete. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 269(24), 3021-3024. https://doi.org/10.1016/j.nimb.2011.04.074

JYU authors or editors

Publication details

All authors or editors: Laitinen, Mikko; Sajavaara, Timo; Rossi, Mikko; Julin, Jaakko; Puurunen, R.L.; Suni, T.; Ishida, T.; Fujita, H.; Arstila, K.; Brijs, B.; et al.

Journal or series: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

ISSN: 0168-583X

Publication year: 2011

Volume: 269

Issue number: 24

Pages range: 3021-3024

Publisher: Elsevier

Place of Publication: Amsterdam

Publication country: Netherlands

Publication language: English

DOI: https://doi.org/10.1016/j.nimb.2011.04.074

Publication open access: Not open

Publication channel open access:

Publication is parallel published (JYX): https://jyx.jyu.fi/handle/123456789/52188

Additional information: Proceedings of the 10th European Conference on Accelerators in Applied Research and Technology (ECAART10)

Free keywords: ToF-ERDA; depth profiling; nanolaminate

Contributing organizations

Ministry reporting: Yes

Reporting Year: 2011

Preliminary JUFO rating: Not rated