A1 Journal article (refereed)
Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL (2012)

Buchner, S., Roche, N., Warner, J., McMorrow, D., Miller, F., Morand, S., Pouget, V., Larue, C., Ferlet-Cavrois, V., Mamouni, F. E., Kettunen, H., Adell, P., Allen, G., & Aveline, D. (2012). Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL. IEEE Transactions on Nuclear Science, 59(4), 998-998. https://doi.org/10.1109/TNS.2012.2201956

JYU authors or editors

Publication details

All authors or editors: Buchner, S.; Roche, N.; Warner, J.; McMorrow, D.; Miller, F.; Morand, S.; Pouget, V.; Larue, C.; Ferlet-Cavrois, V.; Mamouni, F. El; et al.

Journal or series: IEEE Transactions on Nuclear Science

ISSN: 0018-9499

eISSN: 1558-1578

Publication year: 2012

Volume: 59

Issue number: 4

Pages range: 998-998

Publisher: IEEE

Place of Publication: New York

Publication country: United States

Publication language: English

DOI: https://doi.org/10.1109/TNS.2012.2201956

Publication open access: Not open

Publication channel open access: 

Keywords: wavelength

Free keywords: Heavy ions; operational amplifier; photodiode; pulsed laser; single event transients

Contributing organizations

Ministry reporting: Yes

Reporting Year: 2012

JUFO rating: 1