A1 Journal article (refereed)
Analysis of Impedance and Noise Data of an X-Ray Transition-Edge Sensor Using Complex Thermal Models (2012)

Palosaari, M., Kinnunen, K., Ridder, M. L., van der Kuur, J., Hoevers, H. F. C., & Maasilta, I. (2012). Analysis of Impedance and Noise Data of an X-Ray Transition-Edge Sensor Using Complex Thermal Models. Journal of Low Temperature Physics, 167 (3-4), 129. doi:10.1007/s10909-012-0471-4

JYU authors or editors

Publication details

All authors or editors: Palosaari, Mikko; Kinnunen, Kimmo; Ridder, M.L.; van der Kuur, J.; Hoevers, H.F.C.; Maasilta, Ilari

Journal or series: Journal of Low Temperature Physics

ISSN: 0022-2291

Publication year: 2012

Volume: 167

Issue number: 3-4

Pages range: 129

Publisher: Springer

Place of Publication: Berlin

Publication country: Germany

Publication language: English

DOI: https://doi.org/10.1007/s10909-012-0471-4

Open Access: Publication channel is not openly available

Publication is parallel published: http://arxiv.org/abs/1112.0400

Free keywords: TES Thermal model Impedance Noise

Contributing organizations

Ministry reporting: Yes

Reporting Year: 2012

JUFO rating: 1