A1 Journal article (refereed)
Angular spreading measurements using MeV ion microscopes (2013)

Whitlow, H., Ren, M., Chen, X., Osipowicz, T., van Kan, J. A., & Watt, F. (2013). Angular spreading measurements using MeV ion microscopes. Nuclear instruments and methods in physics research section b: beam interactions with materials and atoms, 306(July), 311-313. https://doi.org/10.1016/j.nimb.2012.11.035

JYU authors or editors

Publication details

All authors or editors: Whitlow, Harry; Ren, Minqin; Chen, Xiao; Osipowicz, Thomas; van Kan, Jeroen A.; Watt, Frank

Journal or series: Nuclear instruments and methods in physics research section b: beam interactions with materials and atoms

ISSN: 0168-583X

eISSN: 1872-9584

Publication year: 2013

Volume: 306

Issue number: July

Pages range: 311–313

Publisher: Elsevier BV

Publication country: Netherlands

Publication language: English

DOI: https://doi.org/10.1016/j.nimb.2012.11.035

Publication open access: Not open

Publication channel open access: 

Free keywords: angular spreading; foil thickness; image blurring; lateral spreading; microscope images; small-angle scattering; square-root dependence; STIM

Contributing organizations

Ministry reporting: Yes

Reporting Year: 2014

JUFO rating: 1