A1 Journal article (refereed)
Dynamic Test Methods for COTS SRAMs (2014)


Tsiligiannis, G., Dilillo, L., Gupta, V., Bosio, A., Girard, P., Virazel, A., Puchner, H., Bosser, A., Javanainen, A., Virtanen, A., Frost, C., Wrobel, F., Dusseau, L., & Saigné, F. (2014). Dynamic Test Methods for COTS SRAMs. IEEE Transactions on Nuclear Science, 61(6), 3095-3102. https://doi.org/10.1109/TNS.2014.2363123


JYU authors or editors


Publication details

All authors or editorsTsiligiannis, G.; Dilillo, L.; Gupta, V.; Bosio, A.; Girard, P.; Virazel, A.; Puchner, H.; Bosser, Alexandre; Javanainen, Arto; Virtanen, Ari; et al.

Journal or seriesIEEE Transactions on Nuclear Science

ISSN0018-9499

eISSN1558-1578

Publication year2014

Volume61

Issue number6

Pages range3095-3102

PublisherIEEE

Publication countryUnited States

Publication languageEnglish

DOIhttps://doi.org/10.1109/TNS.2014.2363123

Publication open accessNot open

Publication channel open access


Keywordsneutrons

Free keywords65 nm; 90 nm; COTS; dynamic test; heavy ions; multiple cell upset (MCU); single event upset (SEU); SRAMs


Contributing organizations


Ministry reportingYes

Reporting Year2014

JUFO rating1


Last updated on 2023-18-12 at 13:12