A1 Journal article (refereed)
SEE on Different Layers of Stacked-SRAMs (2015)

Gupta, V., Bosser, A., Tsiligiannis, G., Rousselet, M., Mohammadzadeh, A., Javanainen, A., Virtanen, A., Puchner, H., Saigné, F., Wrobel, F., & Dilillo, L. (2015). SEE on Different Layers of Stacked-SRAMs. IEEE Transactions on Nuclear Science, 62(6), 2673-2678. https://doi.org/10.1109/TNS.2015.2496725

JYU authors or editors

Publication details

All authors or editors: Gupta, V.; Bosser, Alexandre; Tsiligiannis, G.; Rousselet, M.; Mohammadzadeh, A.; Javanainen, Arto; Virtanen, Ari; Puchner, H.; Saigné, F.; Wrobel, F.; et al.

Journal or series: IEEE Transactions on Nuclear Science

ISSN: 0018-9499

eISSN: 1558-1578

Publication year: 2015

Volume: 62

Issue number: 6

Pages range: 2673-2678

Publisher: Institute of Electrical and Electronics Engineers

Publication country: United States

Publication language: English

DOI: https://doi.org/10.1109/TNS.2015.2496725

Publication open access: Not open

Publication channel open access: 

Free keywords: 90 nm; multiple cell upset (MCU); radiation testing; SEE rate; single event upset (SEU); SRAM; stacked dice; static and dynamic mode testing

Contributing organizations

Ministry reporting: Yes

Reporting Year: 2015

JUFO rating: 1