A4 Article in conference proceedings
A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing (2015)

Bosser, A., Gupta, V., Tsiligiannis, G., Ferraro, R., Frost, C., Javanainen, A., Puchner, H., Rossi, M., Saigné, F., Virtanen, A., Wrobel, F., Zadeh, A., & Dilillo, L. (2015). A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing. In RADECS 2015 : 15th European Conference on Radiation and Its Effects on Components and Systems. IEEE. Diabetic medicine. https://doi.org/10.1109/RADECS.2015.7365578

JYU authors or editors

Publication details

All authors or editors: Bosser, Alexandre; Gupta, V.; Tsiligiannis, G.; Ferraro, R.; Frost, C.; Javanainen, Arto; Puchner, H.; Rossi, Mikko; Saigné, F.; Virtanen, Ari; et al.

Parent publication: RADECS 2015 : 15th European Conference on Radiation and Its Effects on Components and Systems

ISBN: 978-1-5090-0232-0

Journal or series: Diabetic medicine

ISSN: 0742-3071

eISSN: 1464-5491

Publication year: 2015

Publisher: IEEE

Publication country: United States

Publication language: English

DOI: https://doi.org/10.1109/RADECS.2015.7365578

Publication open access: Not open

Publication channel open access: 

Additional information: 15th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2015; Moscow; Russian Federation; 14 September 2015 through 18 September 2015.

Free keywords: bitmap slicing; event accumulation; radiation test; Single Event Upset (SEU); Multiple Cell Upset (MCU); SRAM; static test; dynamic test

Contributing organizations

Ministry reporting: Yes

Reporting Year: 2016

JUFO rating: 1