A1 Journal article (refereed)
Methodologies for the Statistical Analysis of Memory Response to Radiation (2016)

Bosser, A., Gupta, V., Tsiligiannis, G., Frost, C. D., Zadeh, A., Jaatinen, J., Javanainen, A., Puchner, H., Saigné, F., Virtanen, A., Wrobel, F., & Dilillo, L. (2016). Methodologies for the Statistical Analysis of Memory Response to Radiation. IEEE Transactions on Nuclear Science, 63(4), 2122-2128. https://doi.org/10.1109/TNS.2016.2527781

JYU authors or editors

Publication details

All authors or editors: Bosser, Alexandre; Gupta, Viyas; Tsiligiannis, Georgios; Frost, Christopher D.; Zadeh, Ali; Jaatinen, Jukka; Javanainen, Arto; Puchner, Helmut; Saigné, Frédéric; Virtanen, Ari; et al.

Journal or series: IEEE Transactions on Nuclear Science

ISSN: 0018-9499

eISSN: 1558-1578

Publication year: 2016

Volume: 63

Issue number: 4

Pages range: 2122-2128

Publisher: Institute of Electrical and Electronics Engineers

Publication country: United States

Publication language: English

DOI: https://doi.org/10.1109/TNS.2016.2527781

Publication open access: Not open

Publication channel open access: 

Publication is parallel published (JYX): https://jyx.jyu.fi/handle/123456789/51096

Keywords: radiation

Free keywords: memory response; statistical analysis

Contributing organizations

Ministry reporting: Yes

Reporting Year: 2016

JUFO rating: 1