A2 Review article, Literature review, Systematic review
Soft errors in commercial off-the-shelf static random access memories (2017)


Dilillo, L., Tsiligiannis, G., Gupta, V., Bosser, A., Saigne, F., & Wrobel, F. (2017). Soft errors in commercial off-the-shelf static random access memories. Semiconductor Science and Technology, 32 (1), 013006. doi:10.1088/1361-6641/32/1/013006


JYU authors or editors


Publication details

All authors or editors: Dilillo, L.; Tsiligiannis, G.; Gupta, V.; Bosser, Alexandre; Saigne, F.; Wrobel, F.

Journal or series: Semiconductor Science and Technology

ISSN: 0268-1242

Publication year: 2017

Volume: 32

Issue number: 1

Article number: 013006

Publisher: Institute of Physics Publishing

Publication country: United Kingdom

Publication language: English

DOI: https://doi.org/10.1088/1361-6641/32/1/013006

Open Access: Publication channel is not openly available


Free keywords: bitmapping; dynamic mode test; March test; radiation particles; SRAMs; stacked dies; static mode test


Contributing organizations


Ministry reporting: Yes

Reporting Year: 2017

JUFO rating: 1


Last updated on 2020-17-10 at 21:45