A2 Review article, Literature review, Systematic review
Soft errors in commercial off-the-shelf static random access memories (2017)

Dilillo, L., Tsiligiannis, G., Gupta, V., Bosser, A., Saigne, F., & Wrobel, F. (2017). Soft errors in commercial off-the-shelf static random access memories. Semiconductor Science and Technology, 32(1), Article 013006. https://doi.org/10.1088/1361-6641/32/1/013006

JYU authors or editors

Publication details

All authors or editors: Dilillo, L.; Tsiligiannis, G.; Gupta, V.; Bosser, Alexandre; Saigne, F.; Wrobel, F.

Journal or series: Semiconductor Science and Technology

ISSN: 0268-1242

eISSN: 1361-6641

Publication year: 2017

Volume: 32

Issue number: 1

Article number: 013006

Publisher: Institute of Physics Publishing

Publication country: United Kingdom

Publication language: English

DOI: https://doi.org/10.1088/1361-6641/32/1/013006

Publication open access: Not open

Publication channel open access:

Free keywords: bitmapping; dynamic mode test; March test; radiation particles; SRAMs; stacked dies; static mode test

Contributing organizations

Ministry reporting: Yes

Reporting Year: 2017

JUFO rating: 1

Last updated on 2021-09-06 at 19:43