A1 Journal article (refereed)
Application and development of ion-source technology for radiation-effects testing of electronics (2017)


Kalvas, T., Javanainen, A., Kettunen, H., Koivisto, H., Tarvainen, O., & Virtanen, A. (2017). Application and development of ion-source technology for radiation-effects testing of electronics. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 406(Part A), 205-209. https://doi.org/10.1016/j.nimb.2017.02.051


JYU authors or editors


Publication details

All authors or editors: Kalvas, Taneli; Javanainen, Arto; Kettunen, Heikki; Koivisto, Hannu; Tarvainen, Olli; Virtanen, Ari

Journal or series: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

ISSN: 0168-583X

eISSN: 1872-9584

Publication year: 2017

Volume: 406

Issue number: Part A

Pages range: 205-209

Publisher: Elsevier B.V.

Publication country: Netherlands

Publication language: English

DOI: https://doi.org/10.1016/j.nimb.2017.02.051

Publication open access: Not open

Publication channel open access: 

Additional information: Part of special issue: Proceedings of the 12th European Conference on Accelerators in Applied Research and Technology (ECAART12). 3rd–8th July 2016, Jyväskylä, Finland.


Free keywords: ion sources; radiation effects; accelerators; beam cocktails


Contributing organizations

Other organizations:


Ministry reporting: Yes

Reporting Year: 2017

JUFO rating: 1


Last updated on 2023-13-12 at 17:04