A1 Journal article (refereed)
Single Event Upsets Induced by Direct Ionization from Low-Energy Protons in Floating Gate Cells (2017)

Bagatin, M., Gerardin, S., Paccagnella, A., Visconti, A., Virtanen, A., Kettunen, H., Costantino, A., Ferlet-Cavrois, V., & Zadeh, A. (2017). Single Event Upsets Induced by Direct Ionization from Low-Energy Protons in Floating Gate Cells. IEEE Transactions on Nuclear Science, 64(1), 464-470. https://doi.org/10.1109/TNS.2016.2637571

JYU authors or editors

Virtanen, Ari
Kettunen, Heikki

Publication details

All authors or editors: Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro; Visconti, Angelo; Virtanen, Ari; Kettunen, Heikki; Costantino, Alessandra; Ferlet-Cavrois, Véronique; Zadeh, Ali

Journal or series: IEEE Transactions on Nuclear Science

ISSN: 0018-9499

eISSN: 1558-1578

Publication year: 2017

Volume: 64

Issue number: 1

Pages range: 464-470

Publisher: IEEE

Publication country: United States

Publication language: English

DOI: https://doi.org/10.1109/TNS.2016.2637571

Publication open access: Not open