A1 Journal article (refereed)
Microbeam SEE Analysis of MIM Capacitors for GaN Amplifiers (2018)


Kupsc, P., Javanainen, A., Ferlet-Cavrois, V., Muschitiello, M., Barnes, A., Zadeh, A., Calcutt, J., Poivey, C., Stieglauer, H., & Voss, K.-O. (2018). Microbeam SEE Analysis of MIM Capacitors for GaN Amplifiers. IEEE Transactions on Nuclear Science, 65(2), 732-738. https://doi.org/10.1109/TNS.2018.2791564


JYU authors or editors


Publication details

All authors or editorsKupsc, Pawel; Javanainen, Arto; Ferlet-Cavrois, Véronique; Muschitiello, Michele; Barnes, Andrew; Zadeh, Ali; Calcutt, Jordan; Poivey, Christian; Stieglauer, Hermann; Voss, Kay-Obbe

Journal or seriesIEEE Transactions on Nuclear Science

ISSN0018-9499

eISSN1558-1578

Publication year2018

Volume65

Issue number2

Pages range732-738

PublisherInstitute of Electrical and Electronics Engineers

Publication countryUnited States

Publication languageEnglish

DOIhttps://doi.org/10.1109/TNS.2018.2791564

Publication open accessNot open

Publication channel open access


Keywordselectronic componentscapacitorsradiation physics

Free keywordsMetal–insulator–metal (MIM) devices; metal–insulator–semiconductor (MIS) devices; single event effects (SEEs); single event gate rupture


Contributing organizations


Ministry reportingYes

Reporting Year2018

JUFO rating1


Last updated on 2023-13-12 at 22:44