A1 Journal article (refereed)
Mechanisms of Electron-Induced Single Event Upsets in Medical and Experimental Linacs (2018)
Tali, M., Alía, R. G., Brugger, M., Ferlet-Cavrois, V., Corsini, R., Farabolini, W., Javanainen, A., Kastriotou, M., Kettunen, H., Santin, G., Polo, C. B., Tsiligiannis, G., Danzeca, S., & Virtanen, A. (2018). Mechanisms of Electron-Induced Single Event Upsets in Medical and Experimental Linacs. IEEE Transactions on Nuclear Science, 65(8), 1715-1723. https://doi.org/10.1109/TNS.2018.2843388
JYU authors or editors
Publication details
All authors or editors: Tali, Maris; Alía, Rubéen García; Brugger, Markus; Ferlet-Cavrois, Veronique; Corsini, Roberto; Farabolini, Wilfrid; Javanainen, Arto; Kastriotou, Maria; Kettunen, Heikki; Santin, Giovanni; et al.
Journal or series: IEEE Transactions on Nuclear Science
ISSN: 0018-9499
eISSN: 1558-1578
Publication year: 2018
Volume: 65
Issue number: 8
Pages range: 1715-1723
Publisher: IEEE
Publication country: United States
Publication language: English
DOI: https://doi.org/10.1109/TNS.2018.2843388
Publication open access: Not open
Publication channel open access:
Publication is parallel published (JYX): https://jyx.jyu.fi/handle/123456789/73777
Keywords: radiation physics; electrons; particle accelerators
Contributing organizations
Ministry reporting: Yes
Reporting Year: 2018
JUFO rating: 1