A1 Journal article (refereed)
Mechanisms of Electron-Induced Single Event Upsets in Medical and Experimental Linacs (2018)


Tali, M., Alía, R. G., Brugger, M., Ferlet-Cavrois, V., Corsini, R., Farabolini, W., Javanainen, A., Kastriotou, M., Kettunen, H., Santin, G., Polo, C. B., Tsiligiannis, G., Danzeca, S., & Virtanen, A. (2018). Mechanisms of Electron-Induced Single Event Upsets in Medical and Experimental Linacs. IEEE Transactions on Nuclear Science, 65(8), 1715-1723. https://doi.org/10.1109/TNS.2018.2843388


JYU authors or editors


Publication details

All authors or editorsTali, Maris; Alía, Rubéen García; Brugger, Markus; Ferlet-Cavrois, Veronique; Corsini, Roberto; Farabolini, Wilfrid; Javanainen, Arto; Kastriotou, Maria; Kettunen, Heikki; Santin, Giovanni; et al.

Journal or seriesIEEE Transactions on Nuclear Science

ISSN0018-9499

eISSN1558-1578

Publication year2018

Volume65

Issue number8

Pages range1715-1723

PublisherIEEE

Publication countryUnited States

Publication languageEnglish

DOIhttps://doi.org/10.1109/TNS.2018.2843388

Publication open accessNot open

Publication channel open access

Publication is parallel published (JYX)https://jyx.jyu.fi/handle/123456789/73777


Keywordsradiation physicselectronsparticle accelerators


Contributing organizations


Ministry reportingYes

Reporting Year2018

JUFO rating1


Last updated on 2024-08-01 at 17:16