A4 Article in conference proceedings
The effect of microwave power on the Ar9+ and Ar13+ optical emission intensities and ion beam currents in ECRIS (2018)

Kronholm, R., Sakildien, M., Neben, D., Koivisto, H., Kalvas, T., Tarvainen, O., Laulainen, J., & Jones, P. (2018). The effect of microwave power on the Ar9+ and Ar13+ optical emission intensities and ion beam currents in ECRIS. In J. Lettry, E. Mahner, B. Marsh, R. Pardo, & R. Scrivens (Eds.), Proceedings of the 17th International Conference on Ion Sources (Article 040014). AIP Publishing. AIP Conference Proceedings, 2011. https://doi.org/10.1063/1.5053288

JYU authors or editors

Publication details

All authors or editors: Kronholm, Risto; Sakildien, M.; Neben, D.; Koivisto, Hannu; Kalvas, Taneli; Tarvainen, Olli; Laulainen, J.; Jones, P.

Parent publication: Proceedings of the 17th International Conference on Ion Sources

Parent publication editors: Lettry, Jacques; Mahner, Edgar; Marsh, Bruce; Pardo, Richard; Scrivens, Richard

ISBN: 978-0-7354-1727-4

Journal or series: AIP Conference Proceedings

ISSN: 0094-243X

eISSN: 1935-0465

Publication year: 2018

Number in series: 2011

Article number: 040014

Publisher: AIP Publishing

Publication country: United States

Publication language: English

DOI: https://doi.org/10.1063/1.5053288

Publication open access: Not open

Publication channel open access:

Publication is parallel published (JYX): https://jyx.jyu.fi/handle/123456789/59940

Additional information: The 17th International Conference on Ion Sources 15–20 September 2017, Geneva, Switzerland.

Keywords: plasma (gases); plasma technology; microwaves; ions; spectroscopy; cyclotrons

Free keywords: plasma; optical emission spectroscopy

Contributing organizations

Related projects

Ministry reporting: Yes

Reporting Year: 2018

JUFO rating: 1