A4 Article in conference proceedings
The effect of microwave power on the Ar9+ and Ar13+ optical emission intensities and ion beam currents in ECRIS (2018)
Kronholm, R., Sakildien, M., Neben, D., Koivisto, H., Kalvas, T., Tarvainen, O., Laulainen, J., & Jones, P. (2018). The effect of microwave power on the Ar9+ and Ar13+ optical emission intensities and ion beam currents in ECRIS. In J. Lettry, E. Mahner, B. Marsh, R. Pardo, & R. Scrivens (Eds.), Proceedings of the 17th International Conference on Ion Sources (Article 040014). AIP Publishing. AIP Conference Proceedings, 2011. https://doi.org/10.1063/1.5053288
JYU authors or editors
Publication details
All authors or editors: Kronholm, Risto; Sakildien, M.; Neben, D.; Koivisto, Hannu; Kalvas, Taneli; Tarvainen, Olli; Laulainen, J.; Jones, P.
Parent publication: Proceedings of the 17th International Conference on Ion Sources
Parent publication editors: Lettry, Jacques; Mahner, Edgar; Marsh, Bruce; Pardo, Richard; Scrivens, Richard
ISBN: 978-0-7354-1727-4
Journal or series: AIP Conference Proceedings
ISSN: 0094-243X
eISSN: 1935-0465
Publication year: 2018
Number in series: 2011
Article number: 040014
Publisher: AIP Publishing
Publication country: United States
Publication language: English
DOI: https://doi.org/10.1063/1.5053288
Publication open access: Not open
Publication channel open access:
Publication is parallel published (JYX): https://jyx.jyu.fi/handle/123456789/59940
Additional information: The 17th International Conference on Ion Sources 15–20 September 2017, Geneva, Switzerland.
Keywords: plasma (gases); plasma technology; microwaves; ions; spectroscopy; cyclotrons
Free keywords: plasma; optical emission spectroscopy
Contributing organizations
Related projects
- ENSAR2 European Nuclear Science and Application Research 2
- Jokinen, Ari
- European Commission
Ministry reporting: Yes
Reporting Year: 2018
JUFO rating: 1