A1 Journal article (refereed)
Plasmon-Induced Direct Hot-Carrier Transfer at Metal-Acceptor Interfaces (2019)


Kumar, P. V., Rossi, T. P., Marti-Dafcik, D., Reichmuth, D., Kuisma, M., Erhart, P., . . . , & Norris, D. J. (2019). Plasmon-Induced Direct Hot-Carrier Transfer at Metal-Acceptor Interfaces. ACS Nano, 13 (3), 3188-3195. doi:10.1021/acsnano.8b08703


JYU authors or editors


Publication details

All authors or editors: Kumar, Priyank V.; Rossi, Tuomas P.; Marti-Dafcik, Daniel; Reichmuth, Daniel; Kuisma, Mikael; Erhart, Paul; Puska, Martti J.; Norris, David J.

Journal or series: ACS Nano

ISSN: 1936-0851

Publication year: 2019

Volume: 13

Issue number: 3

Pages range: 3188-3195

Publisher: American Chemical Society

Publication country: United States

Publication language: English

DOI: https://doi.org/10.1021/acsnano.8b08703

Open Access: Publication channel is not openly available

Publication is parallel published (JYX): https://jyx.jyu.fi/handle/123456789/63319


Keywords: probability; nanoelectronics; nanostructures; semiconductors; density functional theory

Free keywords: plasmon decay; direct transfer; hot electrons; hot holes; time-dependent density-functional theory


Contributing organizations


Ministry reporting: Yes

Reporting Year: 2019

JUFO rating: 3


Last updated on 2020-18-10 at 21:05