A1 Journal article (refereed)
Low-Power, Subthreshold Reference Circuits for the Space Environment : Evaluated with γ-rays, X-rays, Protons and Heavy Ions (2019)

Andreou, C. M., González-Castaño, D. M., Gerardin, S., Bagatin, M., Rodriguez, F. G., Paccagnella, A., Prokofiev, A. V., Javanainen, A., Virtanen, A., Liberali, V., Calligaro, C., Nahmad, D., & Georgiou, J. (2019). Low-Power, Subthreshold Reference Circuits for the Space Environment : Evaluated with γ-rays, X-rays, Protons and Heavy Ions. Electronics, 8(5), Article 562. https://doi.org/10.3390/electronics8050562

JYU authors or editors

Publication details

All authors or editors: Andreou, Charalambos M.; González-Castaño, Diego Miguel; Gerardin, Simone; Bagatin, Marta; Rodriguez, Faustino Gómez; Paccagnella, Alessandro; Prokofiev, Alexander V.; Javanainen, Arto; Virtanen, Ari; Liberali, Valentino; et al.

Journal or series: Electronics

ISSN: 2079-9292

eISSN: 2079-9292

Publication year: 2019

Volume: 8

Issue number: 5

Article number: 562

Publisher: MDPI AG

Publication country: Switzerland

Publication language: English

DOI: https://doi.org/10.3390/electronics8050562

Publication open access: Openly available

Publication channel open access: Open Access channel

Publication is parallel published (JYX): https://jyx.jyu.fi/handle/123456789/64279

Keywords: radiation physics; microelectronics; microcircuits; ionising radiation; gamma radiation; X-ray radiation; particle radiation; protons

Free keywords: analog single-event transient (ASET); bandgap voltage reference (BGR); CMOS analog integrated circuits; gamma-rays; heavy-ions; ionization; radiation hardening by design (RHBD); reference circuits; single-event effects (SEE); space electronics; total ionization dose (TID); voltage reference; X-rays

Contributing organizations

Ministry reporting: Yes

Reporting Year: 2019

JUFO rating: 0