A1 Journal article (refereed)
Direct Ionization Impact on Accelerator Mixed-Field Soft Error Rate (2020)


Alía, R. G.; Tali, M.; Brugger, M.; Cecchetto, M.; Cerutti, F.; Cononetti, A.; Danzeca, S.; Esposito, L.; Fernández-Martínez, P.; Gilardoni, S.; Infantino, A.; Kastriotou, M.; Kerboub, N. et al. (2020). Direct Ionization Impact on Accelerator Mixed-Field Soft Error Rate. IEEE Transactions on Nuclear Science, 67 (1), 345-352. DOI: 10.1109/TNS.2019.2951307


JYU authors or editors


Publication details

All authors or editors: Alía, R. G.; Tali, M.; Brugger, M.; Cecchetto, M.; Cerutti, F.; Cononetti, A.; Danzeca, S.; Esposito, L.; Fernández-Martínez, P.; Gilardoni, S.; et al.

Journal or series: IEEE Transactions on Nuclear Science

ISSN: 0018-9499

eISSN: 1558-1578

Publication year: 2020

Volume: 67

Issue number: 1

Pages range: 345-352

Publisher: Institute of Electrical and Electronics Engineers

Publication country: United States

Publication language: English

DOI: http://doi.org/10.1109/TNS.2019.2951307

Open Access: Open access publication published in a hybrid channel

Publication is parallel published (JYX): https://jyx.jyu.fi/handle/123456789/67649


Abstract

We investigate, through measurements and simulations, the possible direct ionization impact in the accelerator soft error rate, not considered in standard qualification approaches. Results show that, for a broad variety of state-of-the art commercial components considered in the 65 nm to 16 nm technological range, indirect ionization is still expected to dominate the overall soft-error rate in the accelerator mixed-field. However, the derived critical charges of the most sensitive parts, corresponding to ∼0.7 fC, are expected to be at the limit of rapid direct ionization dominance and soft-error increase.


Keywords: radiation physics; ionising radiation; microelectronics


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Ministry reporting: Yes

Reporting Year: 2020

Preliminary JUFO rating: 1


Last updated on 2020-18-08 at 13:47