A1 Journal article (refereed)
Direct Ionization Impact on Accelerator Mixed-Field Soft Error Rate (2020)
Alía, R. G., Tali, M., Brugger, M., Cecchetto, M., Cerutti, F., Cononetti, A., Danzeca, S., Esposito, L., Fernández-Martínez, P., Gilardoni, S., Infantino, A., Kastriotou, M., Kerboub, N., Lerner, G., Wyrwoll, V., Ferlet-Cavrois, V., Boatella, C., Javanainen, A., Kettunen, H., . . . Puchner, H. (2020). Direct Ionization Impact on Accelerator Mixed-Field Soft Error Rate. IEEE Transactions on Nuclear Science, 67(1), 345-352. https://doi.org/10.1109/TNS.2019.2951307
JYU authors or editors
Publication details
All authors or editors: Alía, R. G.; Tali, M.; Brugger, M.; Cecchetto, M.; Cerutti, F.; Cononetti, A.; Danzeca, S.; Esposito, L.; Fernández-Martínez, P.; Gilardoni, S.; et al.
Journal or series: IEEE Transactions on Nuclear Science
ISSN: 0018-9499
eISSN: 1558-1578
Publication year: 2020
Volume: 67
Issue number: 1
Pages range: 345-352
Publisher: Institute of Electrical and Electronics Engineers
Publication country: United States
Publication language: English
DOI: https://doi.org/10.1109/TNS.2019.2951307
Publication open access: Openly available
Publication channel open access: Partially open access channel
Publication is parallel published (JYX): https://jyx.jyu.fi/handle/123456789/67649
Abstract
We investigate, through measurements and simulations, the possible direct ionization impact in the accelerator soft error rate, not considered in standard qualification approaches. Results show that, for a broad variety of state-of-the art commercial components considered in the 65 nm to 16 nm technological range, indirect ionization is still expected to dominate the overall soft-error rate in the accelerator mixed-field. However, the derived critical charges of the most sensitive parts, corresponding to ∼0.7 fC, are expected to be at the limit of rapid direct ionization dominance and soft-error increase.
Keywords: radiation physics; ionising radiation; microelectronics
Contributing organizations
Related projects
- Radiation and Reliability Challenges for Electronics Used in Space, Aviation, Ground and Accelerators
- Virtanen, Ari
- European Commission
- Utilisation of the High Energy Heavy Ion Test Facility at JYFL for
Component Radiation Studies in 2018 - 2020- Kettunen, Heikki
- European Space Agency
Ministry reporting: Yes
Reporting Year: 2020
JUFO rating: 1