A4 Article in conference proceedings
Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory (2019)


Luza, L. M., Bosser, A., Gupta, V., Javanainen, A., Mohammadzadeh, A., & Dilillo, L. (2019). Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory. In DFT 2019 : Proceedings of the 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IEEE. Proceedings : IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. https://doi.org/10.1109/DFT.2019.8875475


JYU authors or editors


Publication details

All authors or editors: Luza, Lucas Matana; Bosser, Alexandre; Gupta, Viyas; Javanainen, Arto; Mohammadzadeh, Ali; Dilillo, Luigi

Parent publication: DFT 2019 : Proceedings of the 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

Conference:

  • IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Place and date of conference: Noordwijk, Netherlands, 2.-4.10.2019

ISBN: 978-1-7281-2260-1

Journal or series: Proceedings : IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

ISSN: 1550-5774

eISSN: 2377-7966

Publication year: 2019

Publisher: IEEE

Publication country: United States

Publication language: English

DOI: https://doi.org/10.1109/DFT.2019.8875475

Publication open access: Not open

Publication channel open access:


Abstract

Space applications frequently use flash memories for mass storage data. However, the technology applied in the memory array and peripheral circuity are not inherently radiation tolerant. This work introduces the results of radiation test campaigns with heavy ions and protons on a SLC NAND Flash. Static tests showed different failures types. Single events upsets and raw error cross sections were presented, as well as an evaluation of the occurrences of the events. Characterization of effects on the embedded data registers was also performed.


Keywords: radiation physics; ionising radiation; flash memories


Contributing organizations


Ministry reporting: Yes

Reporting Year: 2019

JUFO rating: 1


Last updated on 2021-10-06 at 17:55