A1 Journal article (refereed)
Individual arc-discharge synthesized multiwalled carbon nanotubes probed with multiple measurement techniques (2020)

Ahlskog, M., Hokkanen, M. J., Levshov, D., Svensson, K., Volodin, A., & van Haesendonck, C. (2020). Individual arc-discharge synthesized multiwalled carbon nanotubes probed with multiple measurement techniques. Journal of Vacuum Science and Technology. Part B. Nanotechnology and Microelectronics, 38(4), Article 042804. https://doi.org/10.1116/6.0000187

JYU authors or editors

Publication details

All authors or editors: Ahlskog, Markus; Hokkanen, Matti J.; Levshov, Dmitry; Svensson, Krister; Volodin, Alexander; van Haesendonck, Chris

Journal or series: Journal of Vacuum Science and Technology. Part B. Nanotechnology and Microelectronics

ISSN: 2166-2746

eISSN: 2166-2754

Publication year: 2020

Volume: 38

Issue number: 4

Article number: 042804

Publisher: American Institute of Physics

Publication country: United States

Publication language: English

DOI: https://doi.org/10.1116/6.0000187

Publication open access: Not open

Publication channel open access:

Publication is parallel published (JYX): https://jyx.jyu.fi/handle/123456789/71056

Abstract

Arc-discharge synthesized multiwalled carbon nanotubes (AD-MWNT), or related MWNTs, exhibit a good quality compared to the more common type of MWNT synthesized by catalytic chemical vapor deposition methods. Yet experimental measurements on these are rather few and typically have not correlated data from different measurement techniques. Here, the authors report Raman spectroscopy, scanning probe microscopy, conductivity measurements, and force microscopy on single AD-MWNTs. The results demonstrate the high quality of AD-MWNTs and are compatible with the view of them as the best approximation of MWNTs as an assembly of defect-free concentric individual single-walled carbon nanotubes. The authors also demonstrate conductance measurements over a step on the surface of an AD-MWNT, which is due to an abruptly broken outer layer(s), whereby the interlayer resistance is measured.

Keywords: nanotubes; atomic physics; atomic force microscopy

Free keywords: electronic devices; scanning tunneling microscopy; scanning probe microscopy; scanning electron microscopy; electric discharges; atomic force microscopy; raman spectroscopy; nanotubes

Contributing organizations

Ministry reporting: Yes

Reporting Year: 2020

JUFO rating: 1