A1 Journal article (refereed)
Assessment of Proton Direct Ionization for the Radiation Hardness Assurance of Deep Submicron SRAMs Used in Space Applications (2021)

Coronetti, A., Garcìa Alìa, R., Wang, J., Tali, M., Cecchetto, M., Cazzaniga, C., Javanainen, A., Saigné, F., & Leroux, P. (2021). Assessment of Proton Direct Ionization for the Radiation Hardness Assurance of Deep Submicron SRAMs Used in Space Applications. IEEE Transactions on Nuclear Science, 68(5), 937-948. https://doi.org/10.1109/TNS.2021.3061209

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Publication details

All authors or editorsCoronetti, Andrea; Garcìa Alìa, Rubén; Wang, Jialei; Tali, Maris; Cecchetto, Matteo; Cazzaniga, Carlo; Javanainen, Arto; Saigné, Frédéric; Leroux, Paul

Journal or seriesIEEE Transactions on Nuclear Science



Publication year2021


Issue number5

Pages range937-948


Publication countryUnited States

Publication languageEnglish


Publication open accessOpenly available

Publication channel open accessPartially open access channel

Publication is parallel published (JYX)https://jyx.jyu.fi/handle/123456789/74417


Proton direct ionization from low-energy protons has been shown to have a potentially significant impact on the accuracy of prediction methods used to calculate the upset rates of memory devices in space applications for state-of-the-art deep sub-micron technologies. The general approach nowadays is to consider a safety margin to apply over the upset rate computed from high-energy proton and heavy ion experimental data. The data reported here present a challenge to this approach. Different upset rate prediction methods are used and compared in order to establish the impact of proton direct ionization on the total upset rate. No matter the method employed the findings suggest that proton direct ionization can contribute to up to 90% of the total upset rate on average for a general selection of space orbits, with peaks of up to 99%. Such results suggest that an approach based on the characterization of the low-energy portion of the proton spectrum would be more convenient for similar technologies than the application of a general safety margin. Based on data presented here, the previously proposed margin of 5 is exceeded, by large amounts in some cases.

Keywordsradiation physicsionising radiationprotonsmicroelectronicsmemories (computing)random access memoriesspace technology

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Ministry reportingYes

Reporting Year2021

JUFO rating1

Last updated on 2024-03-04 at 20:06