A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
The pion single-event latch-up cross-section enhancement : mechanisms and consequences for accelerator hardness assurance (2021)
Coronetti, A., Alia Garcia, R., Cerutti, F., Hajdas, W., Söderström, D., Javanainen, A., & Saigne, F. (2021). The pion single-event latch-up cross-section enhancement : mechanisms and consequences for accelerator hardness assurance. IEEE Transactions on Nuclear Science, 68(8), 1613-1622. https://doi.org/10.1109/TNS.2021.3070216
JYU-tekijät tai -toimittajat
Julkaisun tiedot
Julkaisun kaikki tekijät tai toimittajat: Coronetti, Andrea; Alia Garcia, Ruben; Cerutti, Francesco; Hajdas, Wojtek; Söderström, Daniel; Javanainen, Arto; Saigne, Frederic
Lehti tai sarja: IEEE Transactions on Nuclear Science
ISSN: 0018-9499
eISSN: 1558-1578
Julkaisuvuosi: 2021
Volyymi: 68
Lehden numero: 8
Artikkelin sivunumerot: 1613-1622
Kustantaja: Institute of Electrical and Electronics Engineers (IEEE)
Julkaisumaa: Yhdysvallat (USA)
Julkaisun kieli: englanti
DOI: https://doi.org/10.1109/TNS.2021.3070216
Julkaisun avoin saatavuus: Avoimesti saatavilla
Julkaisukanavan avoin saatavuus: Osittain avoin julkaisukanava
Julkaisu on rinnakkaistallennettu (JYX): https://jyx.jyu.fi/handle/123456789/74970
Tiivistelmä
Pions make up a large part of the hadronic environment typical of accelerator mixed-fields. Characterizing device cross-sections against pions is usually disregarded in favour of tests with protons, whose single-event latch-up cross-section is, nonetheless, experimentally found to be lower than that of pions for all energies below 250 MeV. While Monte-Carlo simulations are capable of reproducing such behavior, the reason of the observed pion cross-section enhancement can only be explained by a deeper analysis of the underlying mechanisms dominating proton-silicon and pion-silicon reactions. The mechanisms dominating the single-event latchup response are found to vary with the energy under consideration. While a higher pion nuclear reaction rate, i.e., probability of interaction, can explain the observed latchup cross-section enhancement at energies > 100 MeV, it is the volume-equivalent linear energy transfer (LETEQ) of the secondary ions that keeps the pion latchup response high at lower energies. The higher LETEQ of secondary ions from pion-silicon interactions are caused by the pion absorption mechanism, which is highly exothermic. In spite of the observed higher cross-section for pions, the high-energy hadron approximation is found to still provide reliable estimations of the latch-up response of a device in mixed-field.
YSO-asiasanat: säteilyfysiikka; ionisoiva säteily; protonit; pii; elektroniikkakomponentit; hiukkaskiihdyttimet
Vapaat asiasanat: pions; protons; neutrons; accelerator; SEL; cross-section; radiation hardness assurance; FLUKA; nuclear interactions
Liittyvät organisaatiot
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OKM-raportointi: Kyllä
Raportointivuosi: 2021
JUFO-taso: 1