electronic components
http://www.yso.fi/onto/yso/p9652
Related publications and other outputs
1 of 4
- Effect of 20 MeV Electron Radiation on Long Term Reliability of SiC Power MOSFETs (2023) Niskanen, Kimmo; et al.; A1; OA
- Heavy-Ion-Induced Defects in Degraded SiC Power MOSFETs (2023) Martinella, Corinna; et al.; A1; OA
- Proton Direct Ionization in Sub-Micron Technologies : Test Methodologies and Modelling (2023) Lüdeke, Sascha; et al.; A1; OA
- Proton Irradiation-Induced Reliability Degradation of SiC Power MOSFET (2023) Niskanen, Kimmo; et al.; A1; OA
- SiC MOSFET Micro-Explosion Due to a Single Event Burnout : Analysis at the Device and Die Levels (2023) Coq Germanicus, Rosine; et al.; D3; OA
- Superconductor-ferromagnet hybrids for non-reciprocal electronics and detectors (2023) Geng, Zhuoran; et al.; A1; OA
- Heavy-ion induced single event effects and latent damages in SiC power MOSFETs (2022) Martinella, C.; et al.; A1; OA
- Isotopic Enriched and Natural SiC Junction Barrier Schottky Diodes under Heavy Ion Irradiation (2022) Roed, Ketil; et al.; A1; OA
- Neutron-induced effects on a self-refresh DRAM (2022) Matana, Luza Lucas; et al.; A1; OA
- 0.1-10 MeV Neutron Soft Error Rate in Accelerator and Atmospheric Environments (2021) Cecchetto, Matteo; et al.; A1; OA
