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    electronic components


    http://www.yso.fi/onto/yso/p9652


    Related publications

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    • Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM (2020) Luza, Lucas Matana; et al.; B3; 978-1-7281-5426-8
    • Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET (2020) Niskanen, K.; et al.; A1
    • New Insight into Single-Event Radiation Failure Mechanisms in Silicon Carbide Power Schottky Diodes and MOSFETs (2020) Witulski, Arthur F.; et al.; A4; 978-3-0357-1579-8
    • Results on radiation hardness of black silicon induced junction photodetectors from proton and electron radiation (2020) Heinonen, J; et al.; A1
    • The Pion Single-Event Effect Resonance and its Impact in an Accelerator Environment (2020) Coronetti, Andrea; et al.; A1; OA
    • Unifying Concepts for Ion-Induced Leakage Current Degradation in Silicon Carbide Schottky Power Diodes (2020) Johnson, R. A.; et al.; A1; OA
    • Current Transport Mechanism for Heavy-Ion Degraded SiC MOSFETs (2019) Martinella, Corinna; et al.; A1; OA
    • Enhanced Charge Collection in SiC Power MOSFETs Demonstrated by Pulse-Laser Two-Photon Absorption SEE Experiments (2019) Johnson, Robert A.; et al.; A1; OA
    • Single-event radiation effects in hardened and state-of-the-art components for space and high-energy accelerator applications (2019) Tali, Maris; G5; OA
    • Microbeam SEE Analysis of MIM Capacitors for GaN Amplifiers (2018) Kupsc, Pawel; et al.; A1

    Last updated on 2019-09-04 at 12:32

       
     


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