electronic components
http://www.yso.fi/onto/yso/p9652
Related publications
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- 0.1-10 MeV Neutron Soft Error Rate in Accelerator and Atmospheric Environments (2021) Cecchetto, Matteo; et al.; A1; OA
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- Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies (2021) Martinella, Corinna; et al.; A1; OA
- Improved stability of black silicon detectors using aluminum oxide surface passivation (2021) Heinonen, Juha; et al.; A4; OA; 978-1-5106-4549-3
- Single-event radiation effects in silicon carbide power MOSFETs (2021) Martinella, Corinna; G5; OA; 978-951-39-8726-8
- The pion single-event latch-up cross-section enhancement : mechanisms and consequences for accelerator hardness assurance (2021) Coronetti, Andrea; et al.; A1; OA
- Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM (2020) Luza, Lucas Matana; et al.; B3; 978-1-7281-5426-8
- Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET (2020) Niskanen, K.; et al.; A1
- New Insight into Single-Event Radiation Failure Mechanisms in Silicon Carbide Power Schottky Diodes and MOSFETs (2020) Witulski, Arthur F.; et al.; A4; 978-3-0357-1579-8
- Results on radiation hardness of black silicon induced junction photodetectors from proton and electron radiation (2020) Heinonen, J; et al.; A1
