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    electronic components


    http://www.yso.fi/onto/yso/p9652


    Related publications and other outputs

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    • Heavy-ion induced single event effects and latent damages in SiC power MOSFETs (2022) Martinella, C.; et al.; A1; OA
    • Isotopic Enriched and Natural SiC Junction Barrier Schottky Diodes under Heavy Ion Irradiation (2022) Roed, Ketil; et al.; A1; OA
    • Neutron-induced effects on a self-refresh DRAM (2022) Matana, Luza Lucas; et al.; A1; OA
    • 0.1-10 MeV Neutron Soft Error Rate in Accelerator and Atmospheric Environments (2021) Cecchetto, Matteo; et al.; A1; OA
    • Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment (2021) Söderström, Daniel; et al.; A1; OA
    • Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies (2021) Martinella, Corinna; et al.; A1; OA
    • Improved stability of black silicon detectors using aluminum oxide surface passivation (2021) Heinonen, Juha; et al.; A4; OA; 978-1-5106-4549-3
    • Pulsed Electron Beam induced SEU Effects in a SRAM memory (2021) Wyrwoll, Vanessa; et al.; A4; 978-1-6654-3794-3
    • Single-event radiation effects in silicon carbide power MOSFETs (2021) Martinella, Corinna; G5; OA; 978-951-39-8726-8
    • The pion single-event latch-up cross-section enhancement : mechanisms and consequences for accelerator hardness assurance (2021) Coronetti, Andrea; et al.; A1; OA

    Last updated on 2019-09-04 at 12:32

       
     


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