säteilyfysiikka
http://www.yso.fi/onto/yso/p11069
Liittyvät julkaisut ja muut tuotokset
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- Proton Irradiation-Induced Reliability Degradation of SiC Power MOSFET (2023) Niskanen, Kimmo; et al.; A1; OA
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- Heavy Ion and Proton Induced SEUs in Very Deep Sub-Micron Technologies (2022) Tanios, Bendy; et al.; A4; 979-8-3503-7124-6