space technology
http://www.yso.fi/onto/yso/p17376
Related publications and other outputs
1 of 2
- 0.1-10 MeV Neutron Soft Error Rate in Accelerator and Atmospheric Environments (2021) Cecchetto, Matteo; et al.; A1; OA
- Aalto-1, multi-payload CubeSat : Design, integration and launch (2021) Praks,J.; et al.; A1; OA
- Assessment of Proton Direct Ionization for the Radiation Hardness Assurance of Deep Submicron SRAMs Used in Space Applications (2021) Coronetti, Andrea; et al.; A1; OA
- Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment (2021) Söderström, Daniel; et al.; A1; OA
- High-energy hadron testing and in-orbit single-event latchup predictions and boundaries (2021) Coronetti, Andrea; et al.; A4; 978-1-6654-3794-3
- Noise reduction in asteroid imaging using a miniaturized spectral imager (2021) Wolfmayr, Monika; et al.; B3
- Pulsed Electron Beam induced SEU Effects in a SRAM memory (2021) Wyrwoll, Vanessa; et al.; A4; 978-1-6654-3794-3
- Radiation hardness assurance through system-level testing : risk acceptance, facility requirements, test methodology and data exploitation (2021) Coronetti, Andrea; et al.; A1; OA
- Single-event radiation effects in silicon carbide power MOSFETs (2021) Martinella, Corinna; G5; OA; 978-951-39-8726-8
- Technology Impact on Neutron-Induced Effects in SDRAMs : A Comparative Study (2021) Matana Luza, Lucas; et al.; A4; OA; 978-1-6654-3654-0
